3/8/2024 0 Comments Essential ftir crackIn this work, we demonstrate a technique to detect sub-mm cracks located at the edges of various multicrystalline silicon wafers and solar cells. Currently, very few industry-standard tools can reliably detect sub-mm cracks, which will become more critical for thinner wafers. As wafers become thinner, the critical crack length required for fracture significantly decreases for the same loading conditions. Therefore, there is a need to trace where micro-cracks initiate in the manufacturing line. Micro-cracks in silicon solar cells reduce the mechanical strength of the wafer, and cause breakage during manufacturing, transportation and field operation.
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